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About this Engineering article
Total dose dependence of soft-error hardness in 64 kbit SRAMs evaluated by single-ion microprobe technique by Matsukawa, T.; Kishida, A.; Tanii, T.; Koh, M.; Horita, K.; Hara, K.; Shigeta, B.; Goto, M.; Matsuda, S.; Kuboyama, S.; Ohdomari, I. is a Engineering article available to read on EtoBox.
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- Author
- Matsukawa, T.; Kishida, A.; Tanii, T.; Koh, M.; Horita, K.; Hara, K.; Shigeta, B.; Goto, M.; Matsuda, S.; Kuboyama, S.; Ohdomari, I.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 1994
- Language
- EN
- Field
- Engineering (Physical Sciences)