About this scholarly article

SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Machine Vision Applications in Industrial Inspection IV - Automation of a reclaimer using global and local range-finding systems by Ahn, Hyun S.; Choi, Chin T.; Lee, Kwan H.; Ha, Yeong-Ho; Rao, A. Ravishankar; Chang, Ning is a scholarly article available to read on EtoBox.

Author

Ahn, Hyun S.; Choi, Chin T.; Lee, Kwan H.; Ha, Yeong-Ho; Rao, A. Ravishankar; Chang, Ning

Publisher

SPIE

Published

1996