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Can I read Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization on EtoBox?
Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization by Sheldon X D Tan; Mehdi Tahoori; Taeyoung Kim; Shengcheng Wang; Zeyu Sun; Saman Kiamehr is a engineering available to read on EtoBox.
What is Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization about?
This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit fr
Who reads Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization?
It is typically read by working professionals who need an authoritative practice reference.
Common subject areas: medicine, law, business, engineering.
- Author
- Sheldon X D Tan; Mehdi Tahoori; Taeyoung Kim; Shengcheng Wang; Zeyu Sun; Saman Kiamehr
- Publisher
- Springer International Publishing
- Published
- 2019
- Language
- EN
- ISBN
- 9783030261719
- Category
- engineering
- Subjects
- Engineering, Computer Science, Technology & Engineering
- Updated
- 2026-03-25
More by Sheldon X D Tan; Mehdi Tahoori; Taeyoung Kim; Shengcheng Wang; Zeyu Sun; Saman Kiamehr
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