About this scholarly article

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - ESD Robustness of Silicon Nanowire Transistor (SNWT) Combined with Thermal Analysis and Optimization by Li, Ming; Fan, Jiewen is a scholarly article available to read on EtoBox.

Author

Li, Ming; Fan, Jiewen

Publisher

IEEE

Published

2018

Language

EN