About this scholarly article

SPIE Proceedings [SPIE Optical Engineering for Sensing and Nanotechnology (ICOSN '99) - Yokohama, Japan (Wednesday 16 June 1999)] Optical Engineering for Sensing and Nanotechnology (ICOSN '99) - Rotation angle measurement using an imaging method by Suzuki, Takamasa; Nakamura, Hideki; Greivenkamp, John E.; Sasaki, Osami; Yamaguchi, Ichirou is a scholarly article available to read on EtoBox.

Author

Suzuki, Takamasa; Nakamura, Hideki; Greivenkamp, John E.; Sasaki, Osami; Yamaguchi, Ichirou

Publisher

SPIE

Published

1999