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About this Engineering article
Comparison of beam blanking SEM and heavy ion SEU tests on NASDA's 64 kbit SRAMs by Pesce, A.; Aoki, J.; Hada, T.; Nemoto, N.; Akutsu, T.; Matsuda, S.; Igarashi, T.; Baba, S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Pesce, A.; Aoki, J.; Hada, T.; Nemoto, N.; Akutsu, T.; Matsuda, S.; Igarashi, T.; Baba, S.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 1996
- Language
- EN
- Field
- Engineering (Physical Sciences)