Skip to content

Opening book details…

About this scholarly article

SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Spectroscopic method for temperature measurements in active zone of AlxGa1-xAs DQW laser diodes by Semjonov, A. J.; Kolesov, B.; Svechnikov, Sergey V.; Valakh, Mikhail Y. is a scholarly article available to read on EtoBox.

Author
Semjonov, A. J.; Kolesov, B.; Svechnikov, Sergey V.; Valakh, Mikhail Y.
Publisher
SPIE
Published
1995
Language
EN

More by Semjonov, A. J.; Kolesov, B.; Svechnikov, Sergey V.; Valakh, Mikhail Y.

Browse all works by Semjonov, A. J.; Kolesov, B.; Svechnikov, Sergey V.; Valakh, Mikhail Y.