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About this Engineering article
Charge-dependent oxygen vacancy diffusion in Al2O3-based resistive-random-access-memories by Yang, Moon Young; Kamiya, Katsumasa; Magyari-Köpe, Blanka; Niwa, Masaaki; Nishi, Yoshio; Shiraishi, Kenji is a Engineering article available to read on EtoBox.
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- Author
- Yang, Moon Young; Kamiya, Katsumasa; Magyari-Köpe, Blanka; Niwa, Masaaki; Nishi, Yoshio; Shiraishi, Kenji
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)