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About this Engineering article
Check-bit-reduced codewords using non-2 n data bits for ECC-based self-refresh enhancement techniques in DRAMs by Cha, S.; Yoon, H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Cha, S.; Yoon, H.
- Publisher
- The Institution of Electrical Engineers; Institution of Electrical Engineers; Institute of Electrical Engineers; Institution of Engineering and Technology (IET) (ISSN 0013-5194)
- Published
- 2010
- Field
- Engineering (Physical Sciences)