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Optimal experimental design of STEM measurement of atom column positions by S. Van Aert; A.J. den Dekker; D. Van Dyck; A. van den Bos is a Physics and Astronomy article available to read on EtoBox.

What is Optimal experimental design of STEM measurement of atom column positions about?

A quantitative measure is proposed to evaluate and optimize the design of a high-resolution scanning transmission electron microscopy (STEM) experiment. The proposed measure is related to the measurement of atom column positions. Specifically, it is based on the statistical precision with which the positions of atom columns can be estimated. The optimal design, that is, the combination of tunable microscope parameters for which the precision is highest, is derived for different types of atom columns. The proposed measure is also used to find out if an annular detector is preferable to an axial one and if a C s -corrector pays off in quantitative STEM experiments. In addition, the optimal settings of the STEM are compared to the Scherzer conditions for incoherent imaging and their dependence on the type of object is investigated.

Who reads Optimal experimental design of STEM measurement of atom column positions?

Author

S. Van Aert; A.J. den Dekker; D. Van Dyck; A. van den Bos

Publisher

Elsevier Science; Elsevier ; Elsevier BV (ISSN 0304-3991)

Published

2002

Language

EN

Field

Physics and Astronomy (Physical Sciences)