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About this nonfiction
Computed Electron Micrographs And Defect Identification (Defects in Crystalline Solids) by A.K. HEAD, P. HUMBLE, L.M. CLAREBROUGH, A.J. MORTON and C.T. FORWOOD (Eds.) is a nonfiction available to read on EtoBox.
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- A.K. HEAD, P. HUMBLE, L.M. CLAREBROUGH, A.J. MORTON and C.T. FORWOOD (Eds.)
- Publisher
- Elsevier Science Publishing Co Inc.,U.S
- Published
- 1973
- Language
- EN
- ISBN
- 9780444104625
- Category
- nonfiction
- Subjects
- Engineering, Stem
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