About this scholarly article

SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Optical Fabrication, Testing, and Metrology II - Characterization of complex optical systems based on wavefront retrieval from point spread function by Boehme, B.; Gross, H. is a scholarly article available to read on EtoBox.

Author

Boehme, B.; Gross, H.

Publisher

SPIE

Published

2005