About this scholarly article

2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Variability Due to Orientation Dependent Oxide Thickness in SOI-FinFETs by Dey, S.; Dash, T. P.; Das, S.; Jena, J.; Mohapatra, E.; Maiti, C. K. is a scholarly article available to read on EtoBox.

Author

Dey, S.; Dash, T. P.; Das, S.; Jena, J.; Mohapatra, E.; Maiti, C. K.

Publisher

IEEE

Published

2018