About this Engineering article
Influence of Film Texture on Reliability of Sol-Gel Derived PZT Thin-Film Capacitors by Noguchi, Takashi; Sakurai, Hideaki; Fujii, Jun; Doi, Toshihiro; Watanabe, Toshiaki; Soyama, Nobuyuki is a Engineering article available to read on EtoBox.
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- Author
- Noguchi, Takashi; Sakurai, Hideaki; Fujii, Jun; Doi, Toshihiro; Watanabe, Toshiaki; Soyama, Nobuyuki
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9795)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)