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9. A BJT-based Temperature-to-Digital Converter with ±60mK (3σ) Inaccuracy from -70°C to 125°C in 160nm CMOS 1 by sanjanashiv04 is a document available to read on EtoBox.
This paper presents a BJT-based temperature-to-digital converter (TDC) implemented in 0.16 μm CMOS technology, achieving a remarkable inaccuracy of ±60 mK (3σ) across a temperature range of -55 °C to +125 °C after a single room-temperature trim. The design utilizes dynamic error cancellation techniques and a digital PTAT trim to minimize variations in base-emitter voltages and saturation currents, significantly reducing the need for batch-specific calibration. Experimental results demonstrate that the TDC m
- Author
- sanjanashiv04
- Language
- EN