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About this Engineering article
Probing the Limits of Full-field Linear Local Defect Resonance Identification for Deep Defect Detection by Segers, Joost; Hedayatrasa, Saeid; Poelman, Gaétan; Van Paepegem, Wim; Kersemans, Mathias is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Segers, Joost; Hedayatrasa, Saeid; Poelman, Gaétan; Van Paepegem, Wim; Kersemans, Mathias
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0041-624X)
- Published
- 2020
- Field
- Engineering (Physical Sciences)