Opening book details…
About this Engineering article
Analytical Evaluation of Thermally Oxidized and Deposited Dielectric in NMOS-PMOS devices by Weng, Ming Hung ;Idris, Muhammad I. ;Chan, H.K. ;Murphy, A.E. ;Smith, D.A. ;Clark, D.T. ;Young, R.A.R. ;Ramsay, E.P. ;Horsfall, Alton B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Weng, Ming Hung ;Idris, Muhammad I. ;Chan, H.K. ;Murphy, A.E. ;Smith, D.A. ;Clark, D.T. ;Young, R.A.R. ;Ramsay, E.P. ;Horsfall, Alton B.
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 2016
- Field
- Engineering (Physical Sciences)