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Circuits-Informed Machine Learning Technique for Blind Open-Loop Digital Calibration of SAR ADC by Bhanushali, Sumukh; Maiti, Debnath; Bikkina, Phaneendra; Mikkola, Esko; Sanyal, Arindam is a scholarly article available to read on EtoBox.

What is Circuits-Informed Machine Learning Technique for Blind Open-Loop Digital Calibration of SAR ADC about?

This work presents a supervised machine-learning (ML) approach for blind digital calibration of SAR ADCs without requiring prior knowledge of errors. A low-speed reference ADC is used to train a shallow neural network (NN) to estimate errors in a high-speed ADC by comparing the outputs of the ADCs when their sampling instants align and subtracting these errors in the back-end. The proposed NN-calibration improves SFDR of a 28nm, 12-bit, 84MHz ADC by >38dB while consuming 25.8fJ/conversion-step.

Author

Bhanushali, Sumukh; Maiti, Debnath; Bikkina, Phaneendra; Mikkola, Esko; Sanyal, Arindam

Published

2024

Language

EN