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About this Materials Science article
A Noise Temperature Analysis of the Electrical Degradation of Thin Nanostructured Films by C. Pennetta; L.B. Kiss; Z. Gingl; L. Reggiani is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- C. Pennetta; L.B. Kiss; Z. Gingl; L. Reggiani
- Publisher
- Springer Netherlands; Springer-Verlag; Kluwer Academic Publishers; Springer Science and Business Media LLC; Society for Mining, Metallurgy and Exploration Inc. (ISSN 1388-0764)
- Published
- 2000
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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