Opening book details…
About this nonfiction
Thickness measurements of thin films by multiple-beam interferometry by Bartlett, T. W. is a nonfiction available to read on EtoBox.
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- Bartlett, T. W.
- Publisher
- K-25 Plant, Carbide and Carbon Chemicals Company, 1954.
- Published
- 1954
- Language
- EN
- Category
- nonfiction
More by Bartlett, T. W.
Browse all works by Bartlett, T. W.
Similar books
- Multiple-beam Interferometry of Surfaces and Films by S. Tolansky (1970-05-03) — S. Tolansky (1970)
- Parameter Measurements in Thin Dielectric Films (1999)
- Measurements of Temperature and Humidity Responsive Swelling of Thin Hydrogel Films by Interferometry in an Environmental Chamber — Katrin Unger, Marlene Anzengruber & Anna Maria Coclite
- Thickness-Independent Vibrational Thermal Conductance across Confined Solid-Solution Thin Films
- The Effect of Thickness of Supporting Films for Thin Targets Used in X-ray Intensity Measurements — Fritz, Norman Lisle. (1942)
- Optical Properties of Thickness-controlled PtSe2 Thin Films Studied via Spectroscopic Ellipsometry — Junbo He & Wei Jiang & Xudan Zhu & Rongjun Zhang & Jianlu Wang & Meiping Zhu & Songyou Wang & Yuxiang Zheng & Liangyao Chen