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About this Engineering article
Small-angle subgrain boundaries emanating from dislocation pile-ups in multicrystalline silicon studied with synchrotron white-beam X-ray topography by Oriwol, D.; Carl, E.-R.; Danilewsky, A.N.; Sylla, L.; Seifert, W.; Kittler, M.; Leipner, H.S. is a Engineering article available to read on EtoBox.
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- Author
- Oriwol, D.; Carl, E.-R.; Danilewsky, A.N.; Sylla, L.; Seifert, W.; Kittler, M.; Leipner, H.S.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 1359-6454)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)