About this scholarly article

2007 IEEE International Test Conference - Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I/O characterization applications by Moreira, Jose; Barnes, Heidi; Hoersch, Guenter is a scholarly article available to read on EtoBox.

Author

Moreira, Jose; Barnes, Heidi; Hoersch, Guenter

Publisher

IEEE

Published

2007

Language

EN