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About this Engineering article
Development of Certified Reference Materials and Methods of Calibration of Small-Angle X-Ray Diffractometers for Certification and Standardization of Articles Produced by Nanoindustry by Avilov, A. S.; Baturin, A. S.; Volkov, V. V.; D’yakova, Yu. A.; Ermakova, M. A.; Kuzin, A. Yu.; Marchenkova, M. A.; Mityukhlyaev, V. B.; Seregin, A. Yu.; Sul’yanov, S. N.; Tereshchenko, E. Yu.; Todua, P. A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Avilov, A. S.; Baturin, A. S.; Volkov, V. V.; D’yakova, Yu. A.; Ermakova, M. A.; Kuzin, A. Yu.; Marchenkova, M. A.; Mityukhlyaev, V. B.; Seregin, A. Yu.; Sul’yanov, S. N.; Tereshchenko, E. Yu.; Todua, P. A.
- Publisher
- Springer US; Springer-Verlag; Springer New York LLC; Springer Science and Business Media LLC (ISSN 0543-1972)
- Published
- 2013
- Field
- Engineering (Physical Sciences)