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Measurement-induced criticality and entanglement clusters: a study of 1D and 2D Clifford circuits by Lunt, Oliver; Szyniszewski, Marcin; Pal, Arijeet is a scholarly article available to read on EtoBox.

What is Measurement-induced criticality and entanglement clusters: a study of 1D and 2D Clifford circuits about?

Entanglement transitions in quantum dynamics present a novel class of phase transitions in non-equilibrium systems. When a many-body quantum system undergoes unitary evolution interspersed with monitored random measurements, the steady-state can exhibit a phase transition between volume and area-law entanglement. There is a correspondence between measurement-induced transitions in non-unitary quantum circuits in $d$ spatial dimensions and classical statistical mechanical models in $d+1$ dimensions. In certain limits these models map to percolation, but there is analytical and numerical evidence to suggest that away from these limits the universality class should generically be distinct from percolation. Intriguingly, despite these arguments, numerics on 1D qubit circuits give bulk exponents which are nonetheless close to those of 2D percolation, with possible differences in surface behavior. In the first part of this work we study the critical properties of 2D Clifford circuits. In the bulk, we find many properties suggested by the percolation picture, including matching bulk exponents, and an inverse power-law for the critical entanglement growth, $S(t,L) \sim L(1 - a/t)$, which s

Author
Lunt, Oliver; Szyniszewski, Marcin; Pal, Arijeet
Published
2020
Language
EN

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