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Fully Integrated Charge Pump Without Oxide Breakdown by Jeffrey Liu is a document available to read on EtoBox.

What is Fully Integrated Charge Pump Without Oxide Breakdown about?

This paper considers the design of fully-integrated charge pumps whose output voltage is not capped by the main device voltage limitations such as oxide breakdown. The proposed solutions, which do not need dedicated high-voltage fabrication processes, are compared to conventional circuits with same area occupation.

Author
Jeffrey Liu
Language
EN