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About this Materials Science article
In-situ UHV-Electron Microscopy with Scanning Tunneling Microscope by Takayanagi, K.; Ohshima, Y.; Mohri, K.; Naitoh, Y.; Hirayama, H.; Tanishiro, Y.; Kondo, Y. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Takayanagi, K.; Ohshima, Y.; Mohri, K.; Naitoh, Y.; Hirayama, H.; Tanishiro, Y.; Kondo, Y.
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2002
- Field
- Materials Science (Physical Sciences)