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About this Engineering article
A New Specimen Preparation Technique for the Scanning Electron Microscope by Wong, K. Y.; Tovey, N. K. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wong, K. Y.; Tovey, N. K.
- Publisher
- Thomas Telford; Thomas Telford Ltd.; ICE Publishing Ltd. (ISSN 0016-8505)
- Published
- 1975
- Language
- EN
- Field
- Engineering (Physical Sciences)