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About this Physics and Astronomy article
Improving Transmission Electron Microscopy Characterization of Semiconductors by Minimizing Sample Preparation Artifacts by McCaffrey, J. P.; Sproule, G. I.; Sargent, R. is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- McCaffrey, J. P.; Sproule, G. I.; Sargent, R.
- Publisher
- NRC Research Press; Canadian Science Publishing (ISSN 0008-4204)
- Published
- 1992
- Field
- Physics and Astronomy (Physical Sciences)
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