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Capturing the Complex Physics Behind Universal Grain Size Distributions in Thin Metallic Films by Backofen, R.; Barmak, K.; Elder, K.E.; Voigt, A. is a Engineering article available to read on EtoBox.

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Author
Backofen, R.; Barmak, K.; Elder, K.E.; Voigt, A.
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 1359-6454)
Published
2014
Language
EN
Field
Engineering (Physical Sciences)

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