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About this Engineering article
Determination of Refractive Index, Extinction Coefficient and Thickness of Thin Films by the Method of Waveguide Mode Excitation by Sokolov, V I; Marusin, N V; Panchenko, V Ya; Savelyev, A G; Seminogov, V N; Khaydukov, E V is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Sokolov, V I; Marusin, N V; Panchenko, V Ya; Savelyev, A G; Seminogov, V N; Khaydukov, E V
- Publisher
- Turpion Limited; Turpion ; Turpion Ltd; IOP Publishing (ISSN 1063-7818)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)