About this scholarly article

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Developments in X-Ray Tomography VI - Adaptive acquisition geometry for micro-CT with large format detectors by Sasov, Alexander; Stock, Stuart R.; Nadeem, Faisal; Liu, Xuan; Verelst, Koen is a scholarly article available to read on EtoBox.

Author

Sasov, Alexander; Stock, Stuart R.; Nadeem, Faisal; Liu, Xuan; Verelst, Koen

Publisher

SPIE

Published

2008