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The document discusses the development of an advanced in situ transmission electron microscopy (TEM) microchip that enhances temperature uniformity and spatial resolution for real-time observation of material structures and chemical processes. Utilizing microelectromechanical system (MEMS) technology, the microchip allows for dynamic studies in gas and high-temperature environments, achieving over 95% temperature uniformity across a significant observation area. This innovation aims to improve the understan

Author

nordicstarinstitute

Language

EN