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About this Physics and Astronomy article
Single-event upset tests on the readout electronics for the pixel detectors of the PANDA experiment by Mazza, G; Balossino, I; Calvo, D; Mori, F De; Remigis, P De; Filippi, A; Marcello, S; Mignone, M; Wheadon, R; Zotti, L; Candelori, A; Mattiazzo, S; Silvestrin, L is a Physics and Astronomy article available to read on EtoBox.
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- Author
- Mazza, G; Balossino, I; Calvo, D; Mori, F De; Remigis, P De; Filippi, A; Marcello, S; Mignone, M; Wheadon, R; Zotti, L; Candelori, A; Mattiazzo, S; Silvestrin, L
- Publisher
- IOP Publishing; Institute of Physics (ISSN 1748-0221)
- Published
- 2014
- Field
- Physics and Astronomy (Physical Sciences)