About this scholarly article

SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Machine Vision Applications in Industrial Inspection III - Solder inspection using an object-oriented approach to machine vision by Bowskill, Jerry M.; Katz, T.; Downie, J. H.; Wu, Frederick Y.; Wilson, Stephen S. is a scholarly article available to read on EtoBox.

Author

Bowskill, Jerry M.; Katz, T.; Downie, J. H.; Wu, Frederick Y.; Wilson, Stephen S.

Publisher

SPIE

Published

1995

Language

EN