About this scholarly article

SPIE Proceedings [SPIE Smart Materials, Nano-, and Micro-Smart Systems - Sydney, Australia (Sunday 12 December 2004)] Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II - STM characterization of phosphine adsorption on STM-patterned H:Si(001)surfaces by Hallam, Toby; Chiao, Jung-Chih; Jamieson, David N.; Curson, Neil J.; Oberbeck, Lars; Faraone, Lorenzo; Dzurak, Andrew S.; Simmons, Michelle Y. is a scholarly article available to read on EtoBox.

Author

Hallam, Toby; Chiao, Jung-Chih; Jamieson, David N.; Curson, Neil J.; Oberbeck, Lars; Faraone, Lorenzo; Dzurak, Andrew S.; Simmons, Michelle Y.

Publisher

SPIE

Published

2005

Language

EN